Analyzer, Testing Equipment
3-5074-01 Energy Dispersive Fluorescence X-Ray Analysis Device EDX-LE
model:
3-5074-01
category:
Analyzer, Testing Equipment
Product Description
Product Model: 3-5074-01 Features Features required for […]
Contact Us
Product Details
Product Model: 3-5074-01
Features
- Features required for RoHS/ELV screening analysis are included as standard.
- The device automatically determines everything from the principal component determination to the selection of conditions.
- You can easily set the analysis position while checking the camera image with the sample observation function.
- Equipped with an automatic X-ray tube ball aging function, equipment maintenance can be minimized.
- It has a detector that does not require cooling by liquid nitrogen, thus reducing running costs.
- By adding optional options, you can perform halogen and antimony screening analysis, qualitative and quantitative analysis, matching (Steel type discrimination, variety discrimination), and thin film analysis.
Spec
- Model number: EDX-LE
- Size (mm): 520 x 650 x 420
- Weight (kg): Approx 60
- Set content: Body, PC for control, Printer
- Measurement principle: Fluorescence X-ray analysis method
- Measuring method: Energy dispersive type
- Measurement target: Solid, Liquid, Powder
- Peak identification detection range: 13AL - 92U
- Sample chamber size: Maximum 370 x 320 x 155mm
- Cooling method: Air cooling (with fan)
- Irradiation area: φ3・5・10mm
- Primary filter: 5 types + OPEN
- Type: Si-PIN semiconductor detector
- Counting type: Digital filter counting processing
- Measurement atmosphere: Atmospheric air
- Sample observation: Semiconductor camera
- Supported OS: Windows(R)7
- Power supply: Single-phase AC100V 50/60Hz
- Power cord length: 2.5m
- Measurement principle: Fluorescence X-ray analysis method
- Measuring method: Energy dispersive type
- Measurement target: Solid, liquid, powder
- Peak identification detection range: 13AL - 92U
- Sample chamber size: Maximum 370 x 320 x 155mm
- Cooling method: Air cooling (with fan)
- Irradiation area: φ3・5・10mm
- Primary filter: 5 types + OPEN
- Type: Si-PIN semiconductor detector
- Counting type: Digital filter counting processing
- Measurement atmosphere: Atmospheric air
- Sample observation: Semiconductor camera
- Supported OS: Windows(R)7
- Power supply: Single-phase AC100V 50/60Hz
- Power cord length: 2.5m
Related product recommendations
You may also be interested in the following products
Analyzer, Testing Equipment
Analyzer, Testing Equipment
61-0354-23 ［Discontinued］Cis-1,2-Bis(Phenylsulfonyl)Ethylene for Synthesis 818343 1G 8.18343.0001
model: 61-0354-23
brand: Merck Millipore Corporation
Analyzer, Testing Equipment
61-0364-59 1-Methylnaphthalene for Synthesis 820809 1L 8.20809.1000
model: 61-0364-59
brand: Merck Millipore Corporation
Analyzer, Testing Equipment
61-6881-67 Ground Glass Diff***r φ30mm Sand Blasted Surface (Sand Number Range) #240 DFB1-30C02-240
model: 61-6881-67
brand: SIGMAKOKI CO., LTD.